Inspec Wafer NIST Traceable Standard
Sudbury, MA, USA, October 7, 2013, Inspectrology introduces the IVS InspecTM 200mm NIST Traceable Standard Wafer. The wafer was designed from the ground up as a Metrology standard and daily control wafer. It is certified by Inspectrology tor be traceable to the NIST Standard Reference Material SRM 475 photomask. This wafer also comes with a complete IVS 100 series and IVS 200 series recipe for customers using the IVS platform.